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High-performance a-ITZO TFTs with high bias stability enabled by self-aligned passivation using a-GaOx File

Shi, Yuhao , Shiah, Yu-Shien , Sim, Kihyung , Sasase, Masato , Kim, Junghwan , Hosono, Hideo

Article Issue Date2022-11 View14
High-Performance Indium Gallium Tin Oxide Transistors with an Al2O3 Gate Insulator Deposited by Atomic Layer Deposition at a Low Temperature of 150 degrees C: Roles of Hydrogen and Excess Oxygen in the Al2O3 Dielectric Film File

Choi, Cheol Hee , Kim, Taikyu , Ueda, Shigenori , Shiah, Yu-Shien , Hosono, Hideo , Kim, Junghwan , Jeong, Jae Kyeong

Article Issue Date2021-06 View12
High-Performance P-Channel Tin Halide Perovskite Thin Film Transistor Utilizing a 2D-3D Core-Shell Structure File

Kim, Junghwan , Shiah, Yu-Shien , Sim, Kihyung , Iimura, Soshi , Abe, Katsumi , Tsuji, Masatake , Sasase, Masato , Hosono, Hideo

Article Issue Date2022-02 View9
Implementing Room-Temperature Fabrication of Flexible Amorphous Sn-Si-O TFTs via Defect Control File

Liu, Xianzhe , Zhang, Jianhua , Shiah, Yu-Shien , Kim, Junghwan , Ning, Honglong , Lu, Kuankuan , Cao, Xiuhua , Xu, Wei , Yao, Rihui , Peng, Junbiao

Article Issue Date2021-05 View3
Mobility-stability trade-off in oxide thin-film transistors File

Shiah, Yu-Shien , Sim, Kihyung , Shi, Yuhao , Abet, Katsumi , Ueda, Shigenori , Sasase, Masato , Kim, Junghwan , Hosono, Hideo

Article Issue Date2021-11 View37
Unintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTs File

Shiah, Yu-Shien , Sim, Kihyung , Ueda, Shigenori , Kim, Junghwan , Hosono, Hideo

Article Issue Date2021-09 View4
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